EXPERTISES
X-rays, Extreme Ultraviolet (EUV) and Soft X- ray (SXR) radiation:
• Applications and development of laser-produced plasma EUV and SXR sources, based on gaseous targets.
• High resolution imaging employing SXR/EUV radiation and diffractive optics.
• SXR / "water-window" imaging.
• SXR tomography.
• Coherent and incoherent nanoimaging and microscopy.
Laser & ion-beams / matter interactions
Plasma diagnostics
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Detectors:
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• Characterization of Silicon Carbide (SiC) detectors
• Chemosensor preparation and characterization
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Spectrometry:
• LAMQS (Laser Ablation coupled by Mass Quadrupole Spectrometer).
• AMS (Accelerator Mass Spectrometry) for 14C analysis.
• IRMS (Isotopic Ratio Mass Spectrometry) for analysis of stable isotopes ratios.
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Material Processing:
• Thin film deposition.
• Ion etching.
• Evaporation.
• Pulse Laser Deposition (PLD).
• Nanoparticle productions by laser ablation.
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Characterization techniques:
• Optical Microscopy.
• Scanning Electron Microscopy (SEM).
• Transmission Electron Microscopy (TEM).
• Focused Ion Beam (FIB).
• Energy dispersive spectroscopy (EDS).
• X-ray Diffraction (XRD).
• X-ray fluorescence (XRF).
• Fourier-transform infrared spectroscopy (FT-IR).
• PIXE (Particle-induced X-ray emission).
• PIGE (Particle-induced gamma-ray emission).
• RBS (Rutherford Back Scattering).
• ERDA (Electron Recoil Detection Analysis).
• Raman.
• Spectrophotometric measurements in the UV-VIS-IR ranges.
Quantum Imaging:
• Correlation Plenoptic Imaging (CPI).
• Correlation Plenoptic Microscopy (CPM).
• Correlation and autocorrelation measurements.
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Simulations & Advanced Softwares:
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• SRIM/TRIM (Stopping and Range of Ions in Matter/Transport of Ion in Matter).
• Zemax (raytracing, optical simulations).
• Mathematica.